30 November 2004 - Purdue University Researchers at Purdue University have created a 'unified model' for predicting the reliability of new designs for silicon transistors - a potential tool that industry could use to save tens of millions of dollars annually in testing costs.
01 December 2003 - Ohio State University Engineers at Ohio State University and their colleagues have taken an unprecedented look at the interface between layers of silicon and other materials in electronic devices.
